서브비주얼영역
Metrology&Inspection
通过不断开发先进技术，实现获得高科技的企业
서브 컨텐츠영역
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Semiconductor Package Test System
Target CSP, FC-BGA Function Open, 4-Wire Open, Short, u-Short, Leak, Spark Test -
LCR Meter
Target Semiconductor / Display Function Impedance Measurement with high speed multi
switching -
AIP (Antena in Package) Tester
Target Semiconductor Function AIP RF Test