| Target | System IC, Image Sensor |
|---|---|
| Type | Wafer |
| Function | Inking (Based on the defect map) |
| Target | All Types of Wafer |
|---|---|
| Type | Wafer |
| Function | Defect Inspection, Probe mark |
| Target | Color lens, Clear lens |
|---|---|
| Type | Hard Type Lens, Soft Type lens |
| Function | Defect Inspection(F/M, Damage, pattern),Power |
| Target | Mobile, IT, Automotive, TV |
|---|---|
| Type | Sheet Type Film, Optical Film |
| Function | Defect Inspection(F/M, Damage, Scratch) |